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1

[IEEE 2007 IEEE International Conference on Integrated Circuit Design and Technology - Austin, TX, USA (2007.05.30-2007.06.1)] 2007 IEEE International Conference on Integrated Circuit Design and Technology - Novel Variation-Aware Circuit Design of Scaled LTPS TFT for Ultra low Power, Low-Cost Applications

Li, Jing, Kang, Kunhyuk, Roy, Kaushik

Year:

2007

Language:

english

File:

PDF, 9.99 MB

english, 2007

2

Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits

Paul, B.C., Kunhyuk Kang, Kufluoglu, H., Alam, M.A., Roy, K.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2007

Language:

english

File:

PDF, 706 KB

english, 2007

3

Variation Estimation and Compensation Technique in Scaled LTPS TFT Circuits for Low-Power Low-Cost Applications

Jing Li, Kunhyuk Kang, Roy, K.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2009

Language:

english

File:

PDF, 1.51 MB

english, 2009

4

Timed Input Pattern Generation for an Accurate Delay Calculation Under Multiple Input Switching

Seung Hoon Choi, Kunhyuk Kang, Dartu, F., Roy, K.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2010

Language:

english

File:

PDF, 784 KB

english, 2010

5

On-Chip Variability Sensor Using Phase-Locked Loop for Detecting and Correcting Parametric Timing Failures

Kunhyuk Kang, Sang Phill Park, Keejong Kim, Roy, K.

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2010

Language:

english

File:

PDF, 2.57 MB

english, 2010

6

Impact of NBTI on the temporal performance degradation of digital circuits

Paul, B.C., Kunhyuk Kang, Kufluoglu, H., Alam, M.A., Roy, K.

Journal:

IEEE Electron Device Letters

Year:

2005

Language:

english

File:

PDF, 200 KB

english, 2005

7

[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - Temporal Performance Degradation under NBTI: Estimation and Design for Improved Reliability of Nanoscale Circuits

Paul, B.C., Kunhyuk Kang,, Kufluoglu, H., Alam, M.A., Roy, K.

Year:

2006

Language:

english

File:

PDF, 173 KB

english, 2006

8

Reliability Implications of Bias-Temperature Instability in Digital ICs

Park, S.P., Kunhyuk Kang, Roy, K.

Journal:

IEEE Design & Test of Computers

Year:

2009

Language:

english

File:

PDF, 1.20 MB

english, 2009

9

Reliability Implications of NBTI in Digital Integrated Circuits

Park, Sang Phill, Kang, Kunhyuk, Roy, Kaushik

Journal:

IEEE Design and Test

Year:

2013

Language:

english

File:

PDF, 561 KB

english, 2013

10

[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Statistical Timing Analysis using Levelized Covariance Propagation

Kunhyuk Kang,, Paul, B.C., Roy, K.

Year:

2005

Language:

english

File:

PDF, 239 KB

english, 2005

11

[IEEE IEEE 2005 Custom Integrated Circuits Conference, 2005. - San Jose, CA, USA (Sept. 18-21, 2005)] Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005. - Fast and accurate estimation of nano-scaled SRAM read failure probability using critical point sampling

Ik Joon Chang,, Kunhyuk Kang,, Mukhopadhyay, S., Kim, C.H., Roy, K.

Year:

2005

Language:

english

File:

PDF, 748 KB

english, 2005

12

[IEEE ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005. - San Jose, CA (Nov. 6-10, 2005)] ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005. - Accurate estimation and modeling of total chip leakage considering inter- & amp; intra-die process variations

Agarwal, A., Kunhyuk Kang,, Roy, K.

Year:

2005

Language:

english

File:

PDF, 529 KB

english, 2005

13

Device-Aware Yield-Centric Dual-$V_{t}$ Design Under Parameter Variations in Nanoscale Technologies

Agarwal, A., Kunhyuk Kang,, Bhunia, S., Gallagher, J.D., Roy, K.

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2007

Language:

english

File:

PDF, 1.63 MB

english, 2007

14

[IEEE ISLPED '05. Proceedings of the 2005 International Symposium on Low Power Electronics and Design - San Diego, CA, USA (2005.08.8-2005.08.10)] ISLPED '05. Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005. - Effectiveness of low power dual-V/sub t/ designs in nano-scale technologies under process parameter variations

Agarwal, A., Kunhyuk Kang,, Bhunia, S.K., Gallagher, J.D., Roy, K.

Year:

2005

Language:

english

File:

PDF, 1.11 MB

english, 2005

15

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Estimation of NBTI Degradation using IDDQ Measurement

Kang, Kunhyuk, Alam, Muhammad Ashraful, Roy, Kaushik

Year:

2007

Language:

english

File:

PDF, 7.86 MB

english, 2007

16

[IEEE 2007 IEEE/ACM International Conference on Computer-Aided Design - San Jose, CA, USA (2007.11.4-2007.11.8)] 2007 IEEE/ACM International Conference on Computer-Aided Design - Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance

Kunhyuk Kang,, Sang Phill Park,, Kaushik Roy,, Alam, Muhammad A.

Year:

2007

Language:

english

File:

PDF, 1.16 MB

english, 2007

17

[IEEE 2008 Asia and South Pacific Design Automation Conference (ASPDAC) - Seoul, South Korea (2008.03.21-2008.03.24)] 2008 Asia and South Pacific Design Automation Conference - NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution?

Kunhyuk Kang,, Saakshi Gangwal,, Park, Sang Phill, Kaushik, Roy

Year:

2008

Language:

english

File:

PDF, 244 KB

english, 2008

18

[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - Reliable and self-repairing sram in nano-scale technologies using leakage and delay monitoring

Mukhopadhyay, S., Kunhyuk Kang,, Mahmoodi, H., Roy, K.

Year:

2005

Language:

english

File:

PDF, 296 KB

english, 2005

19

[IEEE 2006 International Conference on Computer Design - San Jose, CA, USA (2007.10.1-2007.10.4)] 2006 International Conference on Computer Design - Efficient Transistor-Level Sizing Technique under Temporal Performance Degradation due to NBTI

Kang, Kunhyuk, Kufluoglu, Haldun, Alam, Muhammad Ashraful, Roy, Kaushik

Year:

2006

Language:

english

File:

PDF, 435 KB

english, 2006

20

[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Characterization of NBTI induced temporal performance degradation in nano-scale SRAM array using IDDQ

Kunhyuk Kang,, Muhammad Ashraful Alam,, Kaushik Roy,

Year:

2007

Language:

english

File:

PDF, 414 KB

english, 2007

21

[ACM Press the 2005 international symposium - San Diego, CA, USA (2005.08.08-2005.08.10)] Proceedings of the 2005 international symposium on Low power electronics and design - ISLPED '05 - Effectiveness of low power dual-V t designs in nano-scale technologies under process parameter variations

Agarwal, Amit, Kang, Kunhyuk, Bhunia, Swarup K., Gallagher, James D., Roy, Kaushik

Year:

2005

Language:

english

File:

PDF, 790 KB

english, 2005

22

Statistical timing analysis using levelized covariance propagation considering systematic and random variations of process parameters

Kang, Kunhyuk, Paul, Bipul C., Roy, Kaushik

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

2006

Language:

english

File:

PDF, 632 KB

english, 2006

23

[ACM Press the 44th annual conference - San Diego, California (2007.06.04-2007.06.08)] Proceedings of the 44th annual conference on Design automation - DAC '07 - Variation resilient low-power circuit design methodology using on-chip phase locked loop

Kang, Kunhyuk, Kim, Keejong, Roy, Kaushik

Year:

2007

Language:

english

File:

PDF, 479 KB

english, 2007

24

[ACM Press the 44th annual conference - San Diego, California (2007.06.04-2007.06.08)] Proceedings of the 44th annual conference on Design automation - DAC '07 - Characterization and estimation of circuit reliability degradation under NBTI using on-line I DDQ measurement

Kang, Kunhyuk, Kim, Keejong, Islam, Ahmad E., Alam, Muhammad A., Roy, Kaushik

Year:

2007

Language:

english

File:

PDF, 389 KB

english, 2007

25

[ACM Press the 44th annual conference - San Diego, California (2007.06.04-2007.06.08)] Proceedings of the 44th annual conference on Design automation - DAC '07 - High performance and low power electronics on flexible substrate

Li, Jing, Kang, Kunhyuk, Bansal, Aditya, Roy, Kaushik

Year:

2007

Language:

english

File:

PDF, 339 KB

english, 2007